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Proceedings Paper

Transient x-ray diffraction and its application to materials science and x-ray optics
Author(s): Allan A. Hauer; Justin S. Wark; Daniel H. Kalantar; Bruce A. Remington; Roger A. Kopp; James A. Cobble; Bruce Failor; George A. Kyrala; M. Meyers; R. Springer; Thomas R. Boehly
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Paper Abstract

Time resolved x-ray diffraction and scattering have been applied to the measurement of a wide variety of physical phenomena from chemical reactions to shock wave physics. Interest in this method has heightened in recent years with the advent of versatile, high power, pulsed x-ray sources utilizing laser plasmas, electron beams and other methods. In this article, we will describe some of the fundamentals involved in time resolved x-ray diffraction, review some of the history of its development, and describe some recent progress in the field. In this article we will emphasize the use of laser-plasma as the x-ray source for transient diffraction.

Paper Details

Date Published: 14 October 1997
PDF: 12 pages
Proc. SPIE 3157, Applications of X Rays Generated from Lasers and Other Bright Sources, (14 October 1997); doi: 10.1117/12.283986
Show Author Affiliations
Allan A. Hauer, Los Alamos National Lab. (United States)
Justin S. Wark, Univ. of Oxford (United Kingdom)
Daniel H. Kalantar, Lawrence Livermore National Lab. (United States)
Bruce A. Remington, Lawrence Livermore National Lab. (United States)
Roger A. Kopp, Los Alamos National Lab. (United States)
James A. Cobble, Los Alamos National Lab. (United States)
Bruce Failor, Physics International (United States)
George A. Kyrala, Los Alamos National Lab. (United States)
M. Meyers, Univ. of California/San Diego (United States)
R. Springer, Los Alamos National Lab. (United States)
Thomas R. Boehly, Univ. of Rochester (United States)


Published in SPIE Proceedings Vol. 3157:
Applications of X Rays Generated from Lasers and Other Bright Sources
George A. Kyrala; Jean-Claude J. Gauthier, Editor(s)

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