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Proceedings Paper

First results from the new optical configuration for a synchrotron radiation monochromator applied to the ALOISA beamline
Author(s): Dean Cvetko; Luca Floreano; Roberto Gotter; Andrea Marco Malvezzi; Lorena Marassi; Alberto Morgante; Giampiero Naletto; Anna Santaniello; Giovanni Stefani; Fernando Tommasini; Giuseppe Tondello; Alberto Verdini
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Paper Abstract

The new beamline ALOISA is now working at the Elettra synchrotron facility. It is equipped with a monochromator of new design to cover the 200 eV - 8 KeV energy range: the monochromator has two interchangeable dispersive systems, one for the low energies up to 2 KeV using reflection gratings and another with crystals for the higher energies. The monochromatic beam is finally re-focused from the fixed exit slit to inside the experimental chamber by a toroidal mirror. In this paper the results of the first resolution measurements are reported for the low energy section of the monochromator: a resolving power higher than 5000, with peaks of 10000 in the 400 - 500 eV region, is obtained while using all the optical elements at full illumination.

Paper Details

Date Published: 3 November 1997
PDF: 11 pages
Proc. SPIE 3150, Gratings and Grating Monochromators for Synchrotron Radiation, (3 November 1997); doi: 10.1117/12.283979
Show Author Affiliations
Dean Cvetko, INFM (Italy) and Ljubjlana Univ. (Slovenia)
Luca Floreano, INFM (Italy)
Roberto Gotter, INFM (Italy)
Andrea Marco Malvezzi, Univ. di Pavia (Italy)
Lorena Marassi, Univ. of Modena (Italy)
Alberto Morgante, INFM (Italy) and Univ. of Trieste (Italy)
Giampiero Naletto, Univ. of Padua (Italy) and Univ. of California/Berkeley (United States)
Anna Santaniello, Sincrotrone Trieste (Italy)
Giovanni Stefani, Univ. of Rome III (Italy)
Fernando Tommasini, INFM (Italy) and Univ. of Trieste (Italy)
Giuseppe Tondello, Univ. of Padua (Italy)
Alberto Verdini, INFM (Italy) and Univ. of Trieste (Italy)

Published in SPIE Proceedings Vol. 3150:
Gratings and Grating Monochromators for Synchrotron Radiation
Wayne R. McKinney; Christopher A. Palmer, Editor(s)

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