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Proceedings Paper

Backscattering Mueller matrices from bead-blasted aluminium surfaces
Author(s): Gareth D. Lewis; David L. Jordan
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Paper Abstract

The backscattering Mueller matrices for a range of bead- blasted aluminium samples having a range of surface roughness and slopes are investigated using a 632.8nm linearly polarized HeNe laser. The analyzing polarizing optics and detector are fixed in the backscattering direction and the angle of incidence varied from 0 degrees to 90 degrees. A computer controlled Mueller matrix scatterometer determines the matrix elements. The incident polarization states are set via combinations of a polarizer and waveplates and the backscattered light is Fourier analyzed using a rotating compensator and fixed linear polarizer. The surfaces were characterized using a surface profilometer and the variation of the Mueller matrix elements with incidence angle determined. Only four elements of the normalized Mueller matrix are non-zero. Of these, three vary with incidence angle and the fourth is normalized to unity. A depolarization term PD calculated from the matrix elements is shown to decrease with increasing angle of incidence. Its value at normal incidence reduces with increasing bead-blast pressure.

Paper Details

Date Published: 3 October 1997
PDF: 11 pages
Proc. SPIE 3121, Polarization: Measurement, Analysis, and Remote Sensing, (3 October 1997); doi: 10.1117/12.283874
Show Author Affiliations
Gareth D. Lewis, Defence Evaluation and Research Agency Malvern (United Kingdom)
David L. Jordan, Defence Evaluation and Research Agency Malvern (United Kingdom)


Published in SPIE Proceedings Vol. 3121:
Polarization: Measurement, Analysis, and Remote Sensing
Dennis H. Goldstein; Russell A. Chipman, Editor(s)

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