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Proceedings Paper

Mueller-matrix ellipsometry: a review
Author(s): Rasheed M. A. Azzam
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Paper Abstract

Techniques for the partial or complete determination of the Mueller matrix of elastic light scattering by a given samples are reviewed. Important developments include several implementations and applications of the dual-rotating- retarder Mueller-matrix ellipsometer and the addition of imaging, scanning, and spectroscopic capabilities. The use of a multi-channel division-of-amplitude photopolarimeter as a polarization state detector, and the propose modulation of the polarization state generator have substantially increased the efficiency and speed with which the full Mueller matrix can be measured.

Paper Details

Date Published: 3 October 1997
PDF: 10 pages
Proc. SPIE 3121, Polarization: Measurement, Analysis, and Remote Sensing, (3 October 1997); doi: 10.1117/12.283870
Show Author Affiliations
Rasheed M. A. Azzam, Univ. of New Orleans (United States)


Published in SPIE Proceedings Vol. 3121:
Polarization: Measurement, Analysis, and Remote Sensing
Dennis H. Goldstein; Russell A. Chipman, Editor(s)

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