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Proceedings Paper

Visible Mueller matrix spectropolarimetry
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Paper Abstract

A Mueller matrix spectropolarimeter operating between 400- 900nm has been developed for optical element characterization at The University of Alabama in Huntsville. Mueller matrices are measured as a function of wavelength and the spectral behavior of the polarization properties can be determined. Measurements of an achromatic retarder in transmission, a reflective beamsplitter, and the electro- optic dispersion of a spatial light modulator will be presented.

Paper Details

Date Published: 3 October 1997
PDF: 5 pages
Proc. SPIE 3121, Polarization: Measurement, Analysis, and Remote Sensing, (3 October 1997); doi: 10.1117/12.283855
Show Author Affiliations
Elizabeth A. Sornsin, Univ. of Alabama in Huntsville (United States)
Russell A. Chipman, Univ. of Alabama in Huntsville (United States)


Published in SPIE Proceedings Vol. 3121:
Polarization: Measurement, Analysis, and Remote Sensing
Dennis H. Goldstein; Russell A. Chipman, Editor(s)

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