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Proceedings Paper

Polarization rendering for modeling of coherent polarized speckle backscatter using TASAT
Author(s): Keith A. Bush; Gregg A. Crockett; Calvin C. Barnard; David G. Voelz; James F. Riker
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Paper Abstract

TASAT is a detailed tracking and controls simulation developed for modeling electro-optic tracking and imaging scenarios. In our work, the polarization rendering capabilities of TASAT have been exploited to arrive at a methodology for modeling coherent polarized speckle backscatter from an illuminated object. For coherent illumination, we form a complex combination of the polarized rendered fields with random phase and propagate them to the far field to simulate polarized speckle. The speckle return is then analyzed using a four-channel polarimeter model to yield four Stokes parameter fields. We review the approach used in developing the TASAT polarization rendering model and its extension to obtain polarized speckle and Stokes parameter fields. We then show that the simulation provides results which agree with theory and which illustrate polarization measurement variations with object constituent material properties and different object models. Stokes parameter spatial statistics are used to analyze simulation results. Our results suggest that these statistics may be useful in characterizing the effective polarization properties of object materials and for providing a diagnostic signature for some object.s

Paper Details

Date Published: 3 October 1997
PDF: 13 pages
Proc. SPIE 3121, Polarization: Measurement, Analysis, and Remote Sensing, (3 October 1997); doi: 10.1117/12.283854
Show Author Affiliations
Keith A. Bush, Logicon R&D Associates (United States)
Gregg A. Crockett, Logicon R&D Associates (United States)
Calvin C. Barnard, Logicon R&D Associates (United States)
David G. Voelz, Air Force Phillips Lab. (United States)
James F. Riker, Air Force Phillips Lab. (United States)

Published in SPIE Proceedings Vol. 3121:
Polarization: Measurement, Analysis, and Remote Sensing
Dennis H. Goldstein; Russell A. Chipman, Editor(s)

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