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Proceedings Paper

Updated results from performance characterization and calibration of the TRWIS III hyperspectral imager
Author(s): Mark A. Folkman; Stephanie R. Sandor-Leahy; Sveinn Thordarson; Ted R. Hedman; Darrell A. Gleichauf; Suzanne Casement; Bill H. Quon; Peter J. Jarecke
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Paper Abstract

The tremendous potential for hyperspectral imagery as a remote sensing tool has driven the development of TRW's TRWIS III hyperspectral imager. This instrument provides 384 contiguous spectral channels at 5 nm to 6.25 nm spectral resolution covering the 400 nm to 2450 nm wavelength range. The spectra of each pixel in the scene are gathered simultaneously at signal to noise ratios of several hundred to one for typical Earth scenes. Designed to fly on a wide range of aircraft and with variable frame rate, the ground resolution can be varied from approximately 50 cm to 11 m depending on the aircraft altitude and speed. Meeting critical performance requirements for image quality, co- registration of spectral samples, spectral calibration, noise, and radiometric accuracy are important to the success of the instrument. TRWIS III performance has been validated and the instrument has been radiometrically calibrated using TRW's Multispectral Test Bed. This paper discusses the characterization and calibration process and results of the measurements. An example of results from a flight at the end of 1996 is included.

Paper Details

Date Published: 31 October 1997
PDF: 12 pages
Proc. SPIE 3118, Imaging Spectrometry III, (31 October 1997); doi: 10.1117/12.283823
Show Author Affiliations
Mark A. Folkman, TRW Space & Electronics Group (United States)
Stephanie R. Sandor-Leahy, TRW Space & Electronics Group (United States)
Sveinn Thordarson, TRW Space & Electronics Group (United States)
Ted R. Hedman, TRW Space & Electronics Group (United States)
Darrell A. Gleichauf, TRW Space & Electronics Group (United States)
Suzanne Casement, TRW Space & Electronics Group (United States)
Bill H. Quon, TRW Space & Electronics Group (United States)
Peter J. Jarecke, TRW Space & Electronics Group (United States)


Published in SPIE Proceedings Vol. 3118:
Imaging Spectrometry III
Michael R. Descour; Sylvia S. Shen, Editor(s)

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