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Proceedings Paper

Multilayer coatings for narrowband imaging in the extreme ultraviolet
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Paper Abstract

Multilayer coatings for narrowband imaging in the extreme ultraviolet (EUV) have been designed and prepared. Multilayers were designed to optimize reflectivity at O+ 83.4 nm spectral line, and simultaneously to reject radiation at 121.6 nm Lyman (alpha) hydrogen line. Al/MgF2/Mo multilayer coatings were prepared and high reflection/suppression ratios at the above wavelengths were measured. The coatings also exhibited a dip in reflectivity at 102.6 nm Lyman (beta) . The coatings showed some slow degradation over time, but maintained a high reflection/suppression ratio after a few months. Sample cleaning was found effective in restoring a very low reflectivity at 121.6 nm for samples aged of over 100 days.

Paper Details

Date Published: 15 October 1997
PDF: 9 pages
Proc. SPIE 3114, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy VIII, (15 October 1997); doi: 10.1117/12.283794
Show Author Affiliations
Juan I. Larruquert, NASA Goddard Space Flight Ctr. (United States)
Ritva A. M. Keski-Kuha, NASA Goddard Space Flight Ctr. (United States)


Published in SPIE Proceedings Vol. 3114:
EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy VIII
Oswald H. W. Siegmund; Mark A. Gummin, Editor(s)

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