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Proceedings Paper

Broadband and large-area x-ray omni sky monitor (BLOSM)
Author(s): William W. Zhang; Robert Petre; Andrew G. Peele; Keith Jahoda; F. E. Marshall; Yang Soong; Nicholas E. White
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Paper Abstract

We present a conceptual design for a new x-ray all sky monitor (ASM). Compared with previous ASMs, its salient features are: (1) it has a focusing capability that increases the signal to background ratio by a factor of 3; (2) it has a broad-band width: 200 eV to 15 keV; (3) it has a large x-ray collection area: approximately 102 cm2; (4) it has a duty cycle of nearly 100%, and (5) it can measure the position of a new source with an accuracy of a few minutes of arc. These features combined open up an opportunity for discovering new phenomena as well as monitoring existing phenomena with unprecedented coverage and sensitivity.

Paper Details

Date Published: 15 October 1997
PDF: 15 pages
Proc. SPIE 3114, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy VIII, (15 October 1997); doi: 10.1117/12.283787
Show Author Affiliations
William W. Zhang, NASA Goddard Space Flight Ctr. (United States)
Robert Petre, NASA Goddard Space Flight Ctr. (United States)
Andrew G. Peele, National Research Council (United States)
Keith Jahoda, NASA Goddard Space Flight Ctr. (United States)
F. E. Marshall, NASA Goddard Space Flight Ctr. (United States)
Yang Soong, NASA Goddard Space Flight Ctr. and Universities' Space Research Association (United States)
Nicholas E. White, NASA Goddard Space Flight Ctr. (United States)


Published in SPIE Proceedings Vol. 3114:
EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy VIII
Oswald H. W. Siegmund; Mark A. Gummin, Editor(s)

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