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Proceedings Paper

Hard x-ray calibration facility design for JEM-X detector on board INTEGRAL
Author(s): Giovanni Pareschi; Filippo Frontera; Carlo Pelliciari; Guido Zavattini; Vittore Carassiti; Federico Evangelisti
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Paper Abstract

The x-ray monitor JEM-X will be flown aboard the ESA mission INTEGRAL for gamma-ray astronomy. It has been conceived to furnish images of celestial sources in fields of the sky 9.1 deg wide in the 3 - 100 keV extended energy band. Careful on- ground calibrations are needed to verify the spectral capabilities of the JEM-X detector. These operations in the 20 - 100 keV energy band are planned to be performed using a hard x-ray (15 - 140 keV) facility operated at University of Ferrara (Italy). We present the apparatus that will be used to carry out these calibrations. In particular we describe a double-reflection fixed-exit system of monochromatization based on silicon crystals that are implemented in the facility.

Paper Details

Date Published: 15 October 1997
PDF: 8 pages
Proc. SPIE 3114, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy VIII, (15 October 1997); doi: 10.1117/12.283783
Show Author Affiliations
Giovanni Pareschi, Osservatorio Astronomico di Brera (Italy)
Filippo Frontera, Univ. degli Studi di Ferrara (Italy)
Carlo Pelliciari, Univ. degli Studi di Ferrara (Italy)
Guido Zavattini, Univ. degli Studi di Ferrara (Italy)
Vittore Carassiti, Univ. degli Studi di Ferrara (Italy)
Federico Evangelisti, Univ. degli Studi di Ferrara (Italy)


Published in SPIE Proceedings Vol. 3114:
EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy VIII
Oswald H. W. Siegmund; Mark A. Gummin, Editor(s)

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