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Proceedings Paper

Objective Crystal Spectrometer (OXS) on the Spectrum-X-y satellite: crystal calibrations
Author(s): Salim Abdali; Finn Erland Christensen; Herbert W. Schnopper; Leif Gerward; Hans-Joachim Wiebicke; Ingolf Halm; Eric Louis; Harm-Jan Voorma; Eberhard Adolf Spiller; Charles Tarrio
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Paper Abstract

The four kinds of crystals; RAP(001), Si(111), LiF(220) and the Co/C multilayer on the super polished Si(111) crystals, together make up the objective crystal spectrometer OXS. They cover a wide energy range extending from 0.16 eV to 8 keV. A study of crystal reflectivity and energy resolution including measurements on RAP, LiF and Co/C and a calculation of Si crystals in the respective wavelength bands has been performed and the results are presented.

Paper Details

Date Published: 15 October 1997
PDF: 15 pages
Proc. SPIE 3114, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy VIII, (15 October 1997); doi: 10.1117/12.283779
Show Author Affiliations
Salim Abdali, Danish Space Research Institute (Denmark)
Finn Erland Christensen, Danish Space Research Institute (Denmark)
Herbert W. Schnopper, Smithsonian Astrophysical Observatory (United States)
Leif Gerward, Technical Univ. of Denmark (Denmark)
Hans-Joachim Wiebicke, Astrophysical Institute of Potsdam (Germany)
Ingolf Halm, Astrophysical Institute of Potsdam (Germany)
Eric Louis, Institute for Plasma Physics Rijnhuizen (Netherlands)
Harm-Jan Voorma, Institute for Plasma Physics Rijnhuizen (Netherlands)
Eberhard Adolf Spiller, Lawrence Livermore National Lab. (United States)
Charles Tarrio, National Institute of Standards and Technology (United States)


Published in SPIE Proceedings Vol. 3114:
EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy VIII
Oswald H. W. Siegmund; Mark A. Gummin, Editor(s)

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