Share Email Print

Proceedings Paper

PN-CCD camera for XMM: performance of high time resolution/bright source operating modes
Author(s): Eckhard Kendziorra; Edgar Bihler; Willy Grubmiller; Baerbel Kretschmar; Markus Kuster; Bernhard Pflueger; Ruediger Staubert; Heinrich W. Braeuninger; Ulrich G. Briel; Norbert Meidinger; Elmar Pfeffermann; Claus Reppin; Diana Stoetter; Lothar Strueder; Peter Holl; Josef Kemmer; Heike Soltau; Christoph von Zanthier
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

The pn-CCD camera is developed as one of the focal plane instruments for the European photon imaging camera (EPIC) on board the x-ray multi mirror (XMM) mission to be launched in 1999. The detector consists of four quadrants of three pn-CCDs each, which are integrated on one silicon wafer. Each CCD has 200 by 64 pixels (150 micrometer by 150 micrometers) with 280 micrometers depletion depth. One CCD of a quadrant is read out at a time, while the four quadrants can be processed independently of each other. In standard imaging mode the CCDs are read out sequentially every 70 ms. Observations of point sources brighter than 1 mCrab will be effected by photon pile- up. However, special operating modes can be used to observe bright sources up to 150 mCrab in timing mode with 30 microseconds time resolution and very bright sources up to several crab in burst mode with 7 microseconds time resolution. We have tested one quadrant of the EPIC pn-CCD camera at line energies from 0.52 keV to 17.4 keV at the long beam test facility Panter in the focus of the qualification mirror module for XMM. In order to test the time resolution of the system, a mechanical chopper was used to periodically modulate the beam intensity. Pulse periods down to 0.7 ms were generated. This paper describes the performance of the pn-CCD detector in timing and burst readout modes with special emphasis on energy and time resolution.

Paper Details

Date Published: 15 October 1997
PDF: 11 pages
Proc. SPIE 3114, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy VIII, (15 October 1997); doi: 10.1117/12.283765
Show Author Affiliations
Eckhard Kendziorra, Univ. Tuebingen (Germany)
Edgar Bihler, Univ. Tuebingen (Germany)
Willy Grubmiller, Univ. Tuebingen (Germany)
Baerbel Kretschmar, Univ. Tuebingen (Germany)
Markus Kuster, Univ. Tuebingen (Germany)
Bernhard Pflueger, Univ. Tuebingen (Germany)
Ruediger Staubert, Univ. Tuebingen (Germany)
Heinrich W. Braeuninger, Max-Planck-Institut fuer Extraterrestrische Physik (Germany)
Ulrich G. Briel, Max-Planck-Institut fuer Extraterrestrische Physik (Germany)
Norbert Meidinger, Max-Planck-Institut fuer Extraterrestrische Physik (Germany)
Elmar Pfeffermann, Max-Planck-Institut fuer Extraterrestrische Physik (Germany)
Claus Reppin, Max-Planck-Institut fuer Extraterrestrische Physik (Germany)
Diana Stoetter, Max-Planck-Institut fuer Extraterrestrische Physik (Germany)
Lothar Strueder, Max-Planck-Institut fuer Extraterrestrische Physik (Germany)
Peter Holl, KETEK GmbH (Germany)
Josef Kemmer, KETEK GmbH (Germany)
Heike Soltau, KETEK GmbH (Germany)
Christoph von Zanthier, KETEK GmbH (Germany)

Published in SPIE Proceedings Vol. 3114:
EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy VIII
Oswald H. W. Siegmund; Mark A. Gummin, Editor(s)

© SPIE. Terms of Use
Back to Top