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Proceedings Paper

PN-CCD camera for XMM: performance of full frame and window operating modes
Author(s): Elmar Pfeffermann; Heinrich W. Braeuninger; Ulrich G. Briel; Konrad Dennerl; Frank Haberl; Gisela D. Hartner; Norbert Meidinger; Claus Reppin; Lothar Strueder; Joachim E. Truemper; Edgar Bihler; Eckhard Kendziorra; Baerbel Kretschmar; Bernhard Pflueger; Peter Holl; Josef Kemmer; Heike Soltau; Christoph von Zanthier
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Paper Abstract

The pn-charge coupled device (pn-CCD) camera was developed as one of the focal plane instruments for the European photon imaging camera (EPIC) on board the x-ray multi mirror (XMM) mission. The homogeneously sensitive detector consists of four quadrants of three pn-CCDs each, which are integrated on a single silicon wafer. Each CCD has an area of 10 mm by 30 mm divided into 64 by 200 pixels with a depletion depth of 280 micrometers. Altogether the sensitive area is 60 mm by 60 mm. In the standard imaging mode (full frame mode) the CCDs are read out sequentially every 70 ms. In addition, different window modes allow imaging of brighter sources by restricting the detector area and reducing the integration time down to 6 ms. We have tested one quadrant of the EPIC pn-CCD camera at line energies from 0.52 keV to 17.4 keV at the long beam test facility PANTER in focus of the qualification mirror module for XMM as well as in a homogeneous x-ray beam. In this paper we describe the tests in the different imaging modes and report on the performance.

Paper Details

Date Published: 15 October 1997
PDF: 12 pages
Proc. SPIE 3114, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy VIII, (15 October 1997); doi: 10.1117/12.283764
Show Author Affiliations
Elmar Pfeffermann, Max-Planck-Institut fuer Extraterrestrische Physik (Germany)
Heinrich W. Braeuninger, Max-Planck-Institut fuer Extraterrestrische Physik (Germany)
Ulrich G. Briel, Max-Planck-Institut fuer Extraterrestrische Physik (Germany)
Konrad Dennerl, Max-Planck-Institut fuer Extraterrestrische Physik (Germany)
Frank Haberl, Max-Planck-Institut fuer Extraterrestrische Physik (Germany)
Gisela D. Hartner, Max-Planck-Institut fuer Extraterrestrische Physik (Germany)
Norbert Meidinger, Max-Planck-Institut fuer Extraterrestrische Physik (Germany)
Claus Reppin, Max-Planck-Institut fuer Extraterrestrische Physik (Germany)
Lothar Strueder, Max-Planck-Institut fuer Extraterrestrische Physik (Germany)
Joachim E. Truemper, Max-Planck-Institut fuer Extraterrestrische Physik (Germany)
Edgar Bihler, Univ. Tuebingen (Germany)
Eckhard Kendziorra, Univ. Tuebingen (Germany)
Baerbel Kretschmar, Univ. Tuebingen (Germany)
Bernhard Pflueger, Univ. Tuebingen (Germany)
Peter Holl, KETEK GmbH (Germany)
Josef Kemmer, KETEK GmbH (Germany)
Heike Soltau, KETEK GmbH (Germany)
Christoph von Zanthier, KETEK GmbH (Germany)


Published in SPIE Proceedings Vol. 3114:
EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy VIII
Oswald H. W. Siegmund; Mark A. Gummin, Editor(s)

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