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Proceedings Paper

Wavelet image processing for optical pattern recognition and feature extraction
Author(s): Casimer M. DeCusatis; A. Abbatte; Daniel M. Litynski; Pankaj K. Das
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Paper Abstract

This paper discusses a new method for performing wavelet-based pattern recognition and feature extraction. Known as 'progressive pattern recognition,' this approach is based on performing a subband transform of a target image and then performing partial correlations with different subband resolutions; it is possible to recognize the image without correlating against the complete wavelet transform, thereby realizing considerable savings in computational time. Computer simulations of palm print recognition are presented, and extensions to both scale and rotation invariant systems and optical implementations are discussed.

Paper Details

Date Published: 22 September 1997
PDF: 12 pages
Proc. SPIE 3110, 10th Meeting on Optical Engineering in Israel, (22 September 1997); doi: 10.1117/12.281396
Show Author Affiliations
Casimer M. DeCusatis, IBM Corp. (United States)
A. Abbatte, U.S. Army Benet Labs. (United States)
Daniel M. Litynski, U.S. Military Academy (United States)
Pankaj K. Das, Rensselaer Polytechnic Institute (United States)

Published in SPIE Proceedings Vol. 3110:
10th Meeting on Optical Engineering in Israel
Itzhak Shladov; Stanley R. Rotman, Editor(s)

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