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Proceedings Paper

Third harmonic generation for nonlinear scanning laser microscopy
Author(s): Y. Barad; M. Horowitz; Yaron Silberberg
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Paper Abstract

Third harmonic generation near the focal point of a tightly focused beam is used to probe microscopical structures of transparent samples. The axial resolution at which this method can resolve interfaces and inhomogeneities is shown to be comparable with the confocal length of the beam. Using 125 femtosecond pulses at 1.5 micrometers , we were able to resolve interfaces with a resolution of 1.2 micrometers and to produce 2D cross-sectional images of the samples used.

Paper Details

Date Published: 22 September 1997
PDF: 5 pages
Proc. SPIE 3110, 10th Meeting on Optical Engineering in Israel, (22 September 1997); doi: 10.1117/12.281367
Show Author Affiliations
Y. Barad, Weizmann Institute of Science (Israel)
M. Horowitz, Weizmann Institute of Science (Israel)
Yaron Silberberg, Weizmann Institute of Science (Israel)

Published in SPIE Proceedings Vol. 3110:
10th Meeting on Optical Engineering in Israel
Itzhak Shladov; Stanley R. Rotman, Editor(s)

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