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Proceedings Paper

3D-metrologies for industrial applications
Author(s): Bernd Breuckmann; Frank Halbauer; Erik Klaas; Michael Kube
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Paper Abstract

Three-dimensional-metrology based on photogrammetric and topometric techniques is a powerful tool for the digitization and measurement of complex three-dimensional scenes and objects. Since several years advanced sensors and measurement systems are available for industrial applications. Especially the integration of topometric systems into measuring- and handling machines is supported by compact and light 3D- sensors. These sensors can be optimized for specific measuring tasks with respect to accuracy, field of view and further parameters. During the last two years one is going to describe both techniques by the same algorithms. Moreover, there are first approaches of 'topogrammetric' systems, that combine photogrammetric and topometric metrologies, especially by using calibration techniques that are well known in photogrammetry and which allow the on-line calibration of 3D- sensors. On the other hand the topometric projection of coded light provides a continuous indexing of the whole measuring scene where photogrammetric methods (without active illumination) are limited to a lower number of discrete index marks.

Paper Details

Date Published: 25 September 1997
PDF: 10 pages
Proc. SPIE 3102, Rapid Prototyping and Flexible Manufacturing, (25 September 1997); doi: 10.1117/12.281314
Show Author Affiliations
Bernd Breuckmann, Breuckmann GmbH (Germany)
Frank Halbauer, Breuckmann GmbH (Germany)
Erik Klaas, Breuckmann GmbH (Germany)
Michael Kube, Breuckmann GmbH (Germany)


Published in SPIE Proceedings Vol. 3102:
Rapid Prototyping and Flexible Manufacturing
Rolf-Juergen Ahlers; Gunther Reinhart, Editor(s)

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