Share Email Print
cover

Proceedings Paper

Use of diffracting optics in metrology and sensing
Author(s): Michael C. Hutley; Richard F. Stevens
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

Diffracting optical components possess certain features that differ from reflecting or refracting optics. We discuss how these properties arise and illustrate how they may be used to advantage in metrology and sensing.

Paper Details

Date Published: 24 September 1997
PDF: 7 pages
Proc. SPIE 3099, Micro-optical Technologies for Measurement, Sensors, and Microsystems II and Optical Fiber Sensor Technologies and Applications, (24 September 1997); doi: 10.1117/12.281238
Show Author Affiliations
Michael C. Hutley, National Physical Lab. (United Kingdom)
Richard F. Stevens, National Physical Lab. (United Kingdom)


Published in SPIE Proceedings Vol. 3099:
Micro-optical Technologies for Measurement, Sensors, and Microsystems II and Optical Fiber Sensor Technologies and Applications
Olivier M. Parriaux; Ernst-Bernhard Kley; Brian Culshaw; Magnus Breidne, Editor(s)

© SPIE. Terms of Use
Back to Top