Share Email Print
cover

Proceedings Paper

Performance of interferometric rotation encoders using diffraction gratings
Author(s): Guy Voirin; Ulrich Benner; Francis S. M. Clube; Yves Darbellay; Olivier M. Parriaux; S. M.O.L. Schneider; Pierre Sixt
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

High resolution optical encoders take advantage of diffraction and interference properties of light. In such components, the scale is a phase grating that diffracts light into several orders; an optical reading system makes two of them to interfere. In state of the art systems, the orders interfere after they have been spatially separated from other orders; this leads to cumbersome reading heads. A compact, fully diffractive optical reading system was designed and realized. This reading system was used for the realization of rotation encoders. Using the competences of the Eureka EU 922 FOTA project partners, the encoder phase gratings were successfully realized and the reading system was implemented in standard rotation encoder housings. Without interpolation the encoder gives 480'000 pulses per revolution with a repeatability of 2.5 pulses.

Paper Details

Date Published: 24 September 1997
PDF: 10 pages
Proc. SPIE 3099, Micro-optical Technologies for Measurement, Sensors, and Microsystems II and Optical Fiber Sensor Technologies and Applications, (24 September 1997); doi: 10.1117/12.281223
Show Author Affiliations
Guy Voirin, Swiss Ctr. for Electronics and Microtechnology (Switzerland)
Ulrich Benner, Baumer Electric AG (Switzerland)
Francis S. M. Clube, Holtronic Technologies SA (Switzerland)
Yves Darbellay, Holtronic Technologies SA (Switzerland)
Olivier M. Parriaux, Swiss Ctr. for Electronics and Microtechnology (Switzerland)
S. M.O.L. Schneider, Baumer Electric AG (Switzerland)
Pierre Sixt, Swiss Ctr. for Electronics and Microtechnology (Switzerland)


Published in SPIE Proceedings Vol. 3099:
Micro-optical Technologies for Measurement, Sensors, and Microsystems II and Optical Fiber Sensor Technologies and Applications
Olivier M. Parriaux; Ernst-Bernhard Kley; Brian Culshaw; Magnus Breidne, Editor(s)

© SPIE. Terms of Use
Back to Top