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Proceedings Paper

Plasmon spectroscopy for high-resolution angular measurements
Author(s): Johannes K. Schaller; Ralf Czepluch; Christo G. Stojanoff
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Paper Abstract

A plasmon surface wave is excited in a thin metallic layer on a dielectric, if the layer is illuminated at an incident angle larger than the critical angle of total reflection. At certain resonance angles, the major part of the incident energy is coupled into the surface wave and the total reflection is attenuated. We probed the resonance peak with a spectrum of incident waves and detected the reflected energy at two incident angles near the resonance peak simultaneously. The ratio of he detected energies is a function of the incident angle, thus facilitating angular measurements. First experimental results indicate a resolution better than 0.001 degrees in a measuring range of 1 degree.

Paper Details

Date Published: 17 September 1997
PDF: 11 pages
Proc. SPIE 3098, Optical Inspection and Micromeasurements II, (17 September 1997); doi: 10.1117/12.281194
Show Author Affiliations
Johannes K. Schaller, Technical Univ. of Aachen (Germany)
Ralf Czepluch, Technical Univ. of Aachen (Germany)
Christo G. Stojanoff, Technical Univ. of Aachen (Germany)


Published in SPIE Proceedings Vol. 3098:
Optical Inspection and Micromeasurements II
Christophe Gorecki, Editor(s)

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