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Proceedings Paper

Two methods for achieving subpixel resolution in phase difference determination by fringe pattern matching
Author(s): Zuobin Wang; Peter John Bryanston-Cross; Duc-Truong Pham
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Paper Abstract

This paper presents the methods of linear interpolation and polynomial curve fitting for achieving sub-pixel resolution phase difference determination by fringe pattern matching. These two methods wee examined by computer simulation and experiment. In computer simulation, the effects of the resolutions of imaging system were also discussed. The computer simulation and experimental result have shown that the method of linear interpolation and that of polynomial curve fitting can both be used to achieve sub-pixel resolution in the measurement of phase difference by fringe pattern matching. The phase difference between fringe patterns is easy to achieve by linear interpolation compared with polynomial curve fitting.

Paper Details

Date Published: 17 September 1997
PDF: 9 pages
Proc. SPIE 3098, Optical Inspection and Micromeasurements II, (17 September 1997); doi: 10.1117/12.281168
Show Author Affiliations
Zuobin Wang, Univ. of Warwick (United Kingdom)
Peter John Bryanston-Cross, Univ. of Warwick (United Kingdom)
Duc-Truong Pham, Univ. of Wales Cardiff (United Kingdom)


Published in SPIE Proceedings Vol. 3098:
Optical Inspection and Micromeasurements II
Christophe Gorecki, Editor(s)

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