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Proceedings Paper

Electronic speckle interferometry with pulsed lasers and practical applications
Author(s): Hans Steinbichler; Steffen Leidenbach
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Paper Abstract

Electronic speckle pattern interferometry (ESPI) with CW- lasers is well introduced in the industry. Using pulse lasers in combination with ESPI techniques expands the technical applications. The combination of double pulse lasers with the ESPI-technique is considered as essential for the industrial application. It expands the application of ESPI systems to the investigation of transient events and the vibration analysis of components under free boundary conditions. However, due to the limited resolution of the CCD-cameras the interferograms show lower signal-to-noise ratio which requests special treatment of the images and new evaluation algorithms, in particular for 3D analysis. First practical applications have already been carried out in the automotive industry.

Paper Details

Date Published: 17 September 1997
PDF: 5 pages
Proc. SPIE 3098, Optical Inspection and Micromeasurements II, (17 September 1997); doi: 10.1117/12.281159
Show Author Affiliations
Hans Steinbichler, Steinbichler Optotechnik GmbH (Germany)
Steffen Leidenbach, Steinbichler Optotechnik GmbH (Germany)


Published in SPIE Proceedings Vol. 3098:
Optical Inspection and Micromeasurements II
Christophe Gorecki, Editor(s)

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