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Proceedings Paper

Hardware-in-the-loop sensor emulation using a universal programmable interface
Author(s): Daniel B. Howe; Paul A. Acevedo; Mark E. Nuwer
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Paper Abstract

Hardware-in-the-loop testing of IR/EO sensor systems requires the application of real-time IR/EO simulation/stimulation technology. Stimulation of the IR/EO system under test can be achieved by either scene projection or by direct signal injection. Although less intrusive, projection technologies are (to date) somewhat immature, thus requiring the use of direct-injection approaches for many sensor test applications. Even where projection can be applied, direct-injection testing provides additional flexibility and test capabilities which can augment the projection-based testing. The development of multiple, system-specific sensor interfaces provides one solution, however it is a very costly approach in terms of both time and money. What is needed is a reconfigurable, universal programmable interface (UPI), which can be utilized with minimal changes to stimulate a wide variety of IR/EO sensor systems. A UPI can also be utilized during the sensor development phase to evaluate and refine sensor designs. An opportunity now exists to leverage emerging trends in technology to develop such an interface, given a clear understanding of the processing and interface requirements. This paper discusses the development of processing and interface requirements for the UPI, as well as the resulting system design concept which will be used for its implementation.

Paper Details

Date Published: 15 July 1997
PDF: 12 pages
Proc. SPIE 3084, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing II, (15 July 1997); doi: 10.1117/12.280959
Show Author Affiliations
Daniel B. Howe, Amherst Systems Inc. (United States)
Paul A. Acevedo, Amherst Systems Inc. (United States)
Mark E. Nuwer, Amherst Systems Inc. (United States)


Published in SPIE Proceedings Vol. 3084:
Technologies for Synthetic Environments: Hardware-in-the-Loop Testing II
Robert Lee Murrer, Editor(s)

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