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Proceedings Paper

Ultraviolet scene simulation for missile approach warning system testing
Author(s): Robert H. Giza; Paul A. Acevedo; John D. Bliss
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Paper Abstract

Ultraviolet (UV) extensions have been incorporated in the Real-time IR/EO Scene Simulator to support hardware-in-the- loop (HWIL) testing of UV missile warning systems. The UV extensions add capability to model missile plume signatures and off-axis atmospheric scattering in the solar blind UV spectral region (200 - 400 nm). Preliminary testing and validation of the UV rendering algorithms were performed. Simulated UV missile signatures were compared to measured static and free-flight test data. This work was performed to support the test and evaluation of modern missile warning systems at Wright labs Integrated Defensive Avionics Lab. This paper will discuss development of HWIL testing capability for UV missile warning receiver systems. Requirements for real-time UV simulation will be defined and a real-time architecture that addresses these requirements will be discussed. Specifically, the development of real- time UV rendering algorithms to support modeling of atmospherics and backgrounds to the UV solar blind wavelength region will be outlined. Issues regarding implementation of spatial UV scattering effects in a real- time rendering environment will be addressed. Development of the UV sensor model, and its potential implementation in a real-time hardware/software direct injection device will be illustrated. The results of some preliminary validation using laboratory and live firing test data will also be discussed.

Paper Details

Date Published: 15 July 1997
PDF: 10 pages
Proc. SPIE 3084, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing II, (15 July 1997); doi: 10.1117/12.280958
Show Author Affiliations
Robert H. Giza, Amherst Systems Inc. (United States)
Paul A. Acevedo, Amherst Systems Inc. (United States)
John D. Bliss, Amherst Systems Inc. (United States)


Published in SPIE Proceedings Vol. 3084:
Technologies for Synthetic Environments: Hardware-in-the-Loop Testing II
Robert Lee Murrer, Editor(s)

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