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Proceedings Paper

Spatial and sampling analysis for a sensor viewing a pixelized projector
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Paper Abstract

This paper presents an analysis of spatial blurring and sampling effects for a sensor viewing a pixelized scene projector. It addresses the ability of a projector to simulate an arbitrary continuous radiance scene using a field of discrete elements. The spatial fidelity of the projector as seen by an imaging sensor is shown to depend critically on the width of the sensor MTF or spatial response function, and the angular spacing between projector pixels. Quantitative results are presented based on a simulation that compares the output of a sensor viewing a reference scene to the output of the sensor viewing a projector display of the reference scene. Dependence on the blur of the sensor and projector, the scene content, and alignment both of features in the scene and sensor samples with the projector pixel locations are addressed. We attempt to determine the projector characteristics required to perform hardware-in-the-loop testing with adequate spatial realism to evaluate seeker functions like autonomous detection, measuring radiant intensities and angular positions or unresolved objects, or performing autonomous recognition and aimpoint selection for resolved objects.

Paper Details

Date Published: 15 July 1997
PDF: 13 pages
Proc. SPIE 3084, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing II, (15 July 1997); doi: 10.1117/12.280952
Show Author Affiliations
Breck A. Sieglinger, Seeker Technologies Inc. (United States)
David S. Flynn, Seeker Technologies Inc. (United States)
Charles F. Coker, Air Force Wright Lab. (United States)

Published in SPIE Proceedings Vol. 3084:
Technologies for Synthetic Environments: Hardware-in-the-Loop Testing II
Robert Lee Murrer, Editor(s)

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