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Proceedings Paper

Optimum oversampling for laser-based and thermal-array scene projection methodologies
Author(s): Sidney L. Steely; R. H. Fugerer; Heard S. Lowry; Ronald Dawbarn
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Paper Abstract

Technology effects are underway at Arnold Engineering Development Center to extend closed-loop Direct Write Scene Generation capabilities to include advanced signal-injection and thermal-array optical projection capabilities. Laser- projection for sensor optics with or without optics installed, signal-injection, and thermal-array optical projection schemes provide direct simulation of dynamic electro-optic sensor systems. FPAs and electro-optic sensors are stimulated with simulated infrared scenes for optical diagnostics and evaluation of focal plane arrays or electro- optic sensor systems, and to simulate complex mission scenarios. Closed-loop operation can provide high-fidelity simulation of complex infrared scenes, sensor optical blurring, and other temporal effects such as jitter. Although all optical stimulation and testing methods have inherent advantages, compromises, and limitations, there is a common desire to not only maximize optical simulation and photonic stimulation fidelity through advanced verification and validation efforts, but to also minimize computational requirements for high-performance diagnostics. Computational and source-to-FPA oversampling have very similar fidelity defects and requirements for signal-injection, laser- projection, and thermal-array optical projection diagnostic- methods. This paper briefly describes scene generation and projection technology and corresponding research devoted to sampling issues and criteria related to FPA oversampling, corresponding fidelity defects, and performance trades.

Paper Details

Date Published: 15 July 1997
PDF: 11 pages
Proc. SPIE 3084, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing II, (15 July 1997); doi: 10.1117/12.280951
Show Author Affiliations
Sidney L. Steely, Sverdrup Technology, Inc. (United States)
R. H. Fugerer, Sverdrup Technology, Inc. (United States)
Heard S. Lowry, Sverdrup Technology, Inc. (United States)
Ronald Dawbarn, Sverdrup Technology, Inc. (United States)

Published in SPIE Proceedings Vol. 3084:
Technologies for Synthetic Environments: Hardware-in-the-Loop Testing II
Robert Lee Murrer, Editor(s)

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