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Proceedings Paper

Real-time infrared test set: assessment and characterization
Author(s): H. Ronald Marlin; Richard L. Bates; Miles H. Sweet; Rowena M. Carlson; R. Barry Johnson; Diehl H. Martin; Ronald Chung; Jon C. Geist; Michael Gaitan; Charles D. Mulford; Eugene S. Zakar; Robert J. Zeto; Russ Olson; Gordon C. Perkins
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Paper Abstract

During the past several years, the technology for designing and fabricating thermal pixel arrays (TPAs) using silicon micromachined CMOS devices has been developed to support the development of a real-time infrared test set (RTIR) for sensors and seekers. The TPA is a custom application- specific integrated circuit device that is fabricated using a low-cost commercial CMOS process. The RTIR is a compact, self-contained test instrument that is intended for test and evaluation of infrared systems in the field. This paper describes characterization of TPA pixels, including directional radiant intensity distribution, spatial radiance distribution, temperature distribution, cross talk, spectral radiance, air pressure effects, and rise and fall times.

Paper Details

Date Published: 15 July 1997
PDF: 8 pages
Proc. SPIE 3084, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing II, (15 July 1997); doi: 10.1117/12.280947
Show Author Affiliations
H. Ronald Marlin, Naval Command, Control and Ocean Surveillance Ctr. (United States)
Richard L. Bates, Naval Command, Control and Ocean Surveillance Ctr. (United States)
Miles H. Sweet, Naval Command, Control and Ocean Surveillance Ctr. (United States)
Rowena M. Carlson, Naval Command, Control and Ocean Surveillance Ctr. (United States)
R. Barry Johnson, Optical E.T.C., Inc. (United States)
Diehl H. Martin, Optical E.T.C., Inc. (United States)
Ronald Chung, Optical E.T.C., Inc. (United States)
Jon C. Geist, Optical E.T.C., Inc. (United States)
Michael Gaitan, National Institute of Standards and Technology (United States)
Charles D. Mulford, U.S. Army Research Lab. (United States)
Eugene S. Zakar, U.S. Army Research Lab. (United States)
Robert J. Zeto, U.S. Army Research Lab. (United States)
Russ Olson, The Titan Corp. (United States)
Gordon C. Perkins, The Titan Corp. (United States)


Published in SPIE Proceedings Vol. 3084:
Technologies for Synthetic Environments: Hardware-in-the-Loop Testing II
Robert Lee Murrer, Editor(s)

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