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Proceedings Paper

Practical accuracy factors in resistor-array infrared scene projector systems
Author(s): Alan P. Pritchard; Mark A. Venables; Stephen Paul Lake; David W. Gough
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Paper Abstract

This is the second in a series of papers describing an on- going investigation into the detailed performance of our resistor array infra-red scene projector devices and systems. The purpose is to extract understanding and information which will enable validation of simulations involving the systems, and design compromises to be resolved. Following last year's conclusions, the importance of Non Uniformity Correction is reinforced and the concept of Local Step Error and its importance is developed and investigated practically. A test methodology is developed, and the first steps in practical measurements are reported.

Paper Details

Date Published: 15 July 1997
PDF: 8 pages
Proc. SPIE 3084, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing II, (15 July 1997); doi: 10.1117/12.280946
Show Author Affiliations
Alan P. Pritchard, British Aerospace PLC (United Kingdom)
Mark A. Venables, British Aerospace PLC (United Kingdom)
Stephen Paul Lake, British Aerospace PLC (United Kingdom)
David W. Gough, British Aerospace PLC (United Kingdom)

Published in SPIE Proceedings Vol. 3084:
Technologies for Synthetic Environments: Hardware-in-the-Loop Testing II
Robert Lee Murrer, Editor(s)

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