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Proceedings Paper

Simplified method for the hardware implementation of nonuniformity correction on a resistor-array infrared scene projector
Author(s): Lawrence E. Jones; Eric M. Olson; Robert Lee Murrer; Allen R. Andrews
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Paper Abstract

Ever increasing developments in imaging infrared (IR) seekers that are being designed for Ballistic Missile Defense Office guided interceptor programs have amplified the necessity for robust hardware-in-the-loop (HWIL) testing to reduce program risk. Successful IR HWIL testing requires a high fidelity spatial, spectral, and temporal IR projector. Recent characterization measurements of a 512 X 512 metal-oxide semiconductor field-effect transistor (MOSFET) resistor array show that resistor array technology is a leading contender for the IR projector. As with any array device, nonuniform performance between individual elements of the array is a concern. This paper addresses a simplified approach to accomplishing the nonuniformity correction of a resistor array in real-time. The first step in this process is to obtain a nominal output curve typical of the resistors' MOSFET output. The key feature of this simplified process is that all output curves specific to individual resistors can be related to this typical curve with a simple gain and offset correction. In practice, the inverse of the typical output curve is stored in a look-up table in order to obtain the required command for a desired output and then a correcting gain and offset are applied. Results from this process show great promise.

Paper Details

Date Published: 15 July 1997
PDF: 12 pages
Proc. SPIE 3084, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing II, (15 July 1997); doi: 10.1117/12.280944
Show Author Affiliations
Lawrence E. Jones, Science Applications International Corp. (United States)
Eric M. Olson, Science Applications International Corp. (United States)
Robert Lee Murrer, Air Force Wright Lab. (United States)
Allen R. Andrews, Computer Science Applications, Inc. (United States)

Published in SPIE Proceedings Vol. 3084:
Technologies for Synthetic Environments: Hardware-in-the-Loop Testing II
Robert Lee Murrer, Editor(s)

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