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Proceedings Paper

Timing considerations for integrating a flickerless projector with an imaging sensor
Author(s): David S. Flynn; Breck A. Sieglinger; Robert Lee Murrer; Lawrence E. Jones; Eric M. Olson; Allen R. Andrews; James A. Gordon
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Paper Abstract

In a series of measurements made to characterize the performance of a Wideband Infrared Scene Projector (WISP) system, timing artifacts were observed in one set of tests in which the projector update was synchronized with the camera readout. The projector was driven with images that varied from frame to frame, and the measured images were examined to determine if they varied from frame to frame in a corresponding manner. It was found that regardless of the relative time delay between the projector update and sensor readout, each output image was a result of two input images. By analyzing the timing characteristics of the camera integration scheme and the WISP update scheme it was possible to understand effects in the measured images and simulate images with the same effects. This paper describes the measurements and the analyses. Although the effects were due to the unique camera integration and readout scheme, the effects could show up when testing other sensors. Thus also presented in this paper are techniques for testing with resistive array projectors, so that the timing artifacts observed with various kinds of cameras are minimized or eliminated.

Paper Details

Date Published: 15 July 1997
PDF: 8 pages
Proc. SPIE 3084, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing II, (15 July 1997); doi: 10.1117/12.280943
Show Author Affiliations
David S. Flynn, Seeker Technologies Inc. (United States)
Breck A. Sieglinger, Seeker Technologies Inc. (United States)
Robert Lee Murrer, Air Force Wright Lab. (United States)
Lawrence E. Jones, Science Applications International Corp. (United States)
Eric M. Olson, Science Applications International Corp. (United States)
Allen R. Andrews, Computer Sciences and Applications, Inc. (United States)
James A. Gordon, CACI-ASG (United States)


Published in SPIE Proceedings Vol. 3084:
Technologies for Synthetic Environments: Hardware-in-the-Loop Testing II
Robert Lee Murrer, Editor(s)

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