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Proceedings Paper

Real-time infrared test set: system design and development
Author(s): R. Barry Johnson; Diehl H. Martin; Ronald Chung; Jon C. Geist; Jack O. Burrell; Jim L. Slemp; Jeffrey R. Umstead; Allen Mann; H. Ronald Marlin; Richard L. Bates; Miles H. Sweet; Donald N. Williams; Rowena M. Carlson; Michael Gaitan; Janet C. Marshall; Charles D. Mulford; Eugene S. Zakar; Robert J. Zeto; Russ Olson; Gordon C. Perkins
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Paper Abstract

During the past several years, the technology for designing and fabricating thermal pixel arrays (TPAs) using silicon micromachined CMOS devices has been developed adequately to support the development of a real-time infrared test set (RTIR) for sensors and seekers. The TPA is a custom application-specific integrated circuit device that is fabricated using a low-cost commercial CMOS process. The system architecture and development of the initial RTIR Test Set is described. The RTIR is a compact, self-contained test instrument that is intended for test and evaluation of infrared systems in the field. In addition to the TPA, the RTIR contains projection optics and electronics which drive the TPA, provide TPA nonuniformity compensation, data translation, data transformation, and user interface. The RTIR can display internal test patterns (static and dynamic), external digital video data, and NTSC video. The initial RTIR unit incorporates a 64 X 64 TPA to provide flickerless infrared scenes at 30 frames per second. Additional TPAs are under development with formats of 128 X 128, 256 X 256, and 512 X 512 pixels.

Paper Details

Date Published: 15 July 1997
PDF: 13 pages
Proc. SPIE 3084, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing II, (15 July 1997); doi: 10.1117/12.280939
Show Author Affiliations
R. Barry Johnson, Optical E.T.C., Inc. (United States)
Diehl H. Martin, Optical E.T.C., Inc. (United States)
Ronald Chung, Optical E.T.C., Inc. (United States)
Jon C. Geist, Optical E.T.C., Inc. (United States)
Jack O. Burrell, Optical E.T.C., Inc. (United States)
Jim L. Slemp, Optical E.T.C., Inc. (United States)
Jeffrey R. Umstead, Optical E.T.C., Inc. (United States)
Allen Mann, Optical E.T.C., Inc. (United States)
H. Ronald Marlin, Naval Command, Control and Ocean Surveillance Ctr. (United States)
Richard L. Bates, Naval Command, Control and Ocean Surveillance Ctr. (United States)
Miles H. Sweet, Naval Command, Control and Ocean Surveillance Ctr. (United States)
Donald N. Williams, Naval Command, Control and Ocean Surveillance Ctr. (United States)
Rowena M. Carlson, Naval Command, Control and Ocean Surveillance Ctr. (United States)
Michael Gaitan, National Institute of Standards and Technology (United States)
Janet C. Marshall, National Institute of Standards and Technology (United States)
Charles D. Mulford, U.S. Army Research Lab. (United States)
Eugene S. Zakar, U.S. Army Research Lab. (United States)
Robert J. Zeto, U.S. Army Research Lab. (United States)
Russ Olson, The Titan Corp. (United States)
Gordon C. Perkins, The Titan Corp. (United States)


Published in SPIE Proceedings Vol. 3084:
Technologies for Synthetic Environments: Hardware-in-the-Loop Testing II
Robert Lee Murrer, Editor(s)

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