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Proceedings Paper

Internal diagnostics for FT-IR spectrometry
Author(s): Jo Ann Simonds; William E. Costello; Roger J. Combs; Robert T. Kroutil
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Paper Abstract

A FT-IR spectrometer thermal stability, responsivity and self emission was evaluated under controlled laboratory conditions. Internal diagnostics provided by the FT-IR spectrometer design insured the acquisition of accurate and precise spectral data. Absorbance measurements performed using the spectrometer agreed to within 3% of the literature values. The internal polystyrene film permitted a reliable assessment of the wavenumber axis registration which is critical in the identification of target analyte spectral features.

Paper Details

Date Published: 23 July 1997
PDF: 15 pages
Proc. SPIE 3082, Electro-Optical Technology for Remote Chemical Detection and Identification II, (23 July 1997); doi: 10.1117/12.280922
Show Author Affiliations
Jo Ann Simonds, Technical Products Group, Inc. (United States)
William E. Costello, Technical Products Group, Inc. (United States)
Roger J. Combs, U.S. Army Edgewood Research, Development and Engineering Ctr. (United States)
Robert T. Kroutil, U.S. Army Edgewood Research, Development and Engineering Ctr. (United States)


Published in SPIE Proceedings Vol. 3082:
Electro-Optical Technology for Remote Chemical Detection and Identification II
Mahmoud Fallahi; Ellen A. Howden, Editor(s)

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