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Proceedings Paper

Morphologic defects in Cr3+:LiCaAlF6 crystals grown by the Czochralski method
Author(s): D. Klimm; K. Seiranian; Peter Reiche; A. Polity; R. Krause-Rehberg
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Paper Abstract

The paper reports on the growth of Cr3+:LiCaAlF6 single crystals by the Czochralski method from a stoichiometric melt of LiF, CaF2, and AlF3. (Cr3+ doping was obtained by the replacement of about 3 Mol-% AlF3 by the corresponding quantity CrF3.) Only the peripheric region and the neck of the crystals have high optical quality, whereas scattering 'needles' of typically 5 multiplied by 5 multiplied by 35 micrometers cubed can be observed in the top region and very small particles very much less than 1 micrometer ('dust') can be observed in the bottom part of the crystals. By EDX element analysis performed after ion beam thinning of the samples the needles were determined to have an excess Ca content in comparison to the LiCaAlF6 matrix. The binary compound LiAlF4 has the highest vapor pressure in the ternary system LiF - CaF2 - AlF3. It can be concluded, that LiAlF4 evaporates continuously during crystal growth, leaving in the melt CaF2 in excess. The incongruently melting compound Ca2AlF7 is considered to be the most probable candidate for the observed scattering centers.

Paper Details

Date Published: 14 July 1997
PDF: 7 pages
Proc. SPIE 3178, Solid State Crystals: Growth and Characterization, (14 July 1997); doi: 10.1117/12.280747
Show Author Affiliations
D. Klimm, Institut fuer Kristallzuechtung (Germany)
K. Seiranian, Institut fuer Kristallzuechtung (Germany)
Peter Reiche, Institut fuer Kristallzuechtung (Germany)
A. Polity, Univ. Halle (Germany)
R. Krause-Rehberg, Univ. Halle (Germany)


Published in SPIE Proceedings Vol. 3178:
Solid State Crystals: Growth and Characterization
Jozef Zmija; Andrzej Majchrowski; Jaroslaw Rutkowski; Jerzy Zielinski, Editor(s)

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