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Proceedings Paper

Investigation of certain diffraction effects in a double-layer optical disk
Author(s): Jang-hoon Yoo; Chul Woo Lee; Dong-Ho Shin; Chanda L. Bartlett; Kit-Iu Cheong; James Kevin Erwin; Masud Mansuripur
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Paper Abstract

We report certain diffraction effects that are pertinent to the operation of double-layer optical recording media. The diffraction of light from the out-of-focus layer and the resulting distribution on the in-focus layer are studied using computer simulations. The findings are then verified by direct measurements. We also describe a technique for analyzing (by computer simulation) the focus-error signa, FES, in systems that use the astigmatic method in conjunction with the double-layer disk. The results of our computer simulations of the FES are compared with those measured in an actual disk drive; good agreement between computation and measurement is obtained.

Paper Details

Date Published: 30 July 1997
PDF: 9 pages
Proc. SPIE 3109, Optical Data Storage 1997 Topical Meeting, (30 July 1997); doi: 10.1117/12.280687
Show Author Affiliations
Jang-hoon Yoo, Samsung Electronics Co., Ltd. (South Korea)
Chul Woo Lee, Samsung Electronics Co., Ltd. (South Korea)
Dong-Ho Shin, Samsung Electronics Co., Ltd. (South Korea)
Chanda L. Bartlett, Optical Sciences Ctr./Univ. of Arizona (United States)
Kit-Iu Cheong, Optical Sciences Ctr./Univ. of Arizona (United States)
James Kevin Erwin, Optical Sciences Ctr./Univ. of Arizona (United States)
Masud Mansuripur, Optical Sciences Ctr./Univ. of Arizona (United States)


Published in SPIE Proceedings Vol. 3109:
Optical Data Storage 1997 Topical Meeting
Henryk Birecki; James Z. Kwiecien, Editor(s)

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