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Proceedings Paper

Paraxial electron imaging system
Author(s): Thomas D. Kegelman
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Paper Abstract

Single and multiple line imaging systems are in general use in the field ofphoton imaging. CRTs, LED arrays, and lasers have formed the base technologies from which specific designs have evolved. In certain applications, such as the exposure of high quality color films, extremely tight tolerances are placed upon intensity uniformity, addressing accuracy, energy density, wave length, and resolution of the source. These demands must often be achieved within a configuration that is low priced, reliable, rugged, and small. Several years ago, the author and his associates were asked to consider the possibility of configuring an electron beam activated phosphor screen device, in which the phosphor plane and the electron beam were paraxial ( parallel axes). It was reasoned that such a structure would offer a substantial advantage in size, performance and cost that inhibited many applications for electron beam systems. The result of this activity is the Paraxial Electron Imaging System (see fig. 1).

Paper Details

Date Published: 1 February 1991
PDF: 9 pages
Proc. SPIE 1454, Beam Deflection and Scanning Technologies, (1 February 1991); doi: 10.1117/12.28052
Show Author Affiliations
Thomas D. Kegelman, Lab. for Imaging Sciences, Inc. (United States)

Published in SPIE Proceedings Vol. 1454:
Beam Deflection and Scanning Technologies
Leo Beiser; Gerald F. Marshall, Editor(s)

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