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Proceedings Paper

Laser atomic fluorescence characterization of materials
Author(s): Sergey B. Mirov; Alex Yu. Dergachev
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Paper Abstract

Laser atomic fluorescence (LAF) is a powerful spectroscopic tool in analytical applications when it is necessary to measure extremely low concentrations of atoms. The main purpose of this method is to determine the presence and absolute concentrations of different elements in materials. In this paper we will describe the basic principles of the method and how advances in lasers, fiberoptics and detectors allow for significant improvement and simplification of the LAF spectrometer.

Paper Details

Date Published: 30 July 1997
PDF: 25 pages
Proc. SPIE 10291, Materials Characterization and Optical Probe Techniques: A Critical Review, 1029108 (30 July 1997); doi: 10.1117/12.279858
Show Author Affiliations
Sergey B. Mirov, The Univ. of Alabama at Birmingham (United States)
Alex Yu. Dergachev, The Univ. of Alabama at Birmingham (United States)


Published in SPIE Proceedings Vol. 10291:
Materials Characterization and Optical Probe Techniques: A Critical Review
Roger A. Lessard; Hilmar Franke, Editor(s)

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