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Proceedings Paper

Z-scan technique for nonlinear materials characterization
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Paper Abstract

We review Z-scan and related techniques for the measurement of the nonlinear optical properties of materials. The Z-scan is a simple technique for measuring the change in phase induced on a laser beam upon propagation through a nonlinear material it gives both the sign and magnitude of this phase change, ΔΦ, which is simply related to the change in index of refraction, An. Additionally, a Z-scan can also separately determine the change in transmission caused by nonlinear absorption that is related to the change in the absorption coefficient, Aa. Importantly, the determination of the nonlinear refraction from Δn is independent of the determination of the nonlinear absorption from Δα, within a quite broad range of these parameters. Thus, for third-order nonlinear responses the real and imaginary parts of the third-order nonlinear susceptibility, χ(3) can be measured. However, Z-scan is sensitive to any nonlinear processes which result in Δα or Δn, so that great care must be taken in interpreting data taken with this or any other nonlinear materials characterization technique.

Paper Details

Date Published: 30 July 1997
PDF: 24 pages
Proc. SPIE 10291, Materials Characterization and Optical Probe Techniques: A Critical Review, 102910Q (30 July 1997); doi: 10.1117/12.279853
Show Author Affiliations
Eric W. Van Stryland, CREOL, The College of Optics and Photonics, Univ. of Central Florida (United States)
Mansoor Sheik-Bahae, Univ. of Central Florida (United States)


Published in SPIE Proceedings Vol. 10291:
Materials Characterization and Optical Probe Techniques: A Critical Review
Roger A. Lessard; Hilmar Franke, Editor(s)

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