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Proceedings Paper

Core level spectroscopy for surface analysis
Author(s): Franz J. Himpsel; R. Treusch; I. Jimenez; Alan F. Jankowski; D. G. J. Sutherland; L. J. Terminello; C. Heske; Rupert C. C. Perera; D. K. Shuh; William M. Tong; James H. Underwood; J. A. Carlisle; T. A. Callcott; Jian Jun Jia; David L. Ederer; Dieter M. Gruen; Alan R. Krauss; D. C. Zuiker; Gary L. Doll
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Paper Abstract

This is a review of the applications that various core level spectroscopies have in surface analysis. Three methods are highlighted, i.e., photoelectron spectroscopy of core level shifts (XPS or ESCA), absorption spectroscopy, and soft X-ray fluorescence. These techniques provide not only elemental analysis at surfaces, but also the chemical state of atoms and molecules in the outermost atomic layers, such as oxidation state, hybridization, and nearest neighbor bonding information. The probing depth can be adjusted in non-destructive fashion from 3 A to 300 A by detecting electrons or photons of variable energies. Advances in detectors and light sources, such as synchrotron radiation, are breaking ground for new applications, such as chemically-resolved microscopy.

Paper Details

Date Published: 30 July 1997
PDF: 17 pages
Proc. SPIE 10291, Materials Characterization and Optical Probe Techniques: A Critical Review, 102910J (30 July 1997); doi: 10.1117/12.279846
Show Author Affiliations
Franz J. Himpsel, Univ. of Wisconsin, Madison (United States)
R. Treusch, Univ. of Wisconsin, Madison (United States)
I. Jimenez, Lawrence Livermore National Lab. (United States)
Alan F. Jankowski, Lawrence Livermore National Lab. (United States)
D. G. J. Sutherland, Lawrence Livermore National Lab. (United States)
L. J. Terminello, Lawrence Livermore National Lab. (United States)
C. Heske, Lawrence Berkeley National Lab. (United States)
Rupert C. C. Perera, Lawrence Berkeley National Lab. (United States)
D. K. Shuh, Lawrence Berkeley National Lab. (United States)
William M. Tong, Lawrence Berkeley National Lab. (United States)
James H. Underwood, Lawrence Berkeley National Lab. (United States)
J. A. Carlisle, Virginia Commonwealth Univ. (United States)
T. A. Callcott, Univ. of Tennessee, Knoxville (United States)
Jian Jun Jia, Univ. of Tennessee, Knoxville (United States)
David L. Ederer, Tulane Univ. (United States)
Dieter M. Gruen, Argonne National Lab. (United States)
Alan R. Krauss, Argonne National Lab. (United States)
D. C. Zuiker, Argonne National Lab. (United States)
Gary L. Doll, Timkin Research (United States)


Published in SPIE Proceedings Vol. 10291:
Materials Characterization and Optical Probe Techniques: A Critical Review
Roger A. Lessard; Hilmar Franke, Editor(s)

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