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Proceedings Paper

Recursive estimation of fast-impedance changes in electrical impedance tomography and a related problem
Author(s): Jari P. Kaipio; Erkki Somersalo; Pasi A. Karjalainen; Marko J. Vauhkonen
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Paper Abstract

We propose a method for the estimation of fast impedance changes in electrical impedance tomography (EIT) and wire tomography (WT). WT is a novel method for the estimation of the temperature profiles of gas flows: a matrix of metal wires whose impedance depends on the temperature (such as nickel or platinum) are placed in the flow and the resistances of each individual wire are tracked. In the EIT problem the impedance changes are assumed to be so fast that all observations on which the reconstruction is based, can not be assumed to be (even approximately) from the same impedance distribution. The proposed method is based on the formulation of the EIT and WT problems first as dynamical state estimation problems and then solving the mean square estimates for the state (discretized impedance distribution) recursively with the Kalman filter. The appropriate evolution models for EIT include generally random walk-based models and in some applications, e.g. human thorax, compartmental models. The evolution model of WT comes directly from the associated parabolic partial differential equation (heat equation).

Paper Details

Date Published: 9 December 1997
PDF: 9 pages
Proc. SPIE 3171, Computational, Experimental, and Numerical Methods for Solving Ill-Posed Inverse Imaging Problems: Medical and Nonmedical Applications, (9 December 1997); doi: 10.1117/12.279725
Show Author Affiliations
Jari P. Kaipio, Univ. of Kuopio (Finland)
Erkki Somersalo, Helsinki Univ. of Technology (Finland)
Pasi A. Karjalainen, Univ. of Kuopio (Finland)
Marko J. Vauhkonen, Univ. of Kuopio (Finland)


Published in SPIE Proceedings Vol. 3171:
Computational, Experimental, and Numerical Methods for Solving Ill-Posed Inverse Imaging Problems: Medical and Nonmedical Applications
Randall Locke Barbour; Mark J. Carvlin; Michael A. Fiddy, Editor(s)

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