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Proceedings Paper

Film calibration for soft x-ray wavelengths
Author(s): Gregory J. Tallents; J. Krishnan; L. Dwivedi; David Neely; I. C. Edmond Turcu
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Paper Abstract

The response of photographic film to X-rays from laser- plasma is of practical interest. Film is often used for the ultimate detection of x-rays in crystal and grating spectrometers and in imaging instruments such as pinhole cameras largely because of its high spatial resolution (approximately 1 - 10 microns). Characteristic curves for wavelengths--3 nm and 23 nm are presented for eight x-ray films (Kodak 101-01, 101-07, 104-02, Kodak Industrex CX, Russian UF-SH4, UF-VR2, Ilford Q plates and Shanghai 5F film). The calibrations were obtained from the emission of laser-produced carbon plasmas and a Ne-like Ge X-ray laser.

Paper Details

Date Published: 14 October 1997
PDF: 10 pages
Proc. SPIE 3157, Applications of X Rays Generated from Lasers and Other Bright Sources, (14 October 1997); doi: 10.1117/12.279423
Show Author Affiliations
Gregory J. Tallents, Univ. of Essex (United Kingdom)
J. Krishnan, Univ. of Essex (United Kingdom)
L. Dwivedi, Univ. of Essex (United Kingdom)
David Neely, Rutherford Appleton Lab. (United States)
I. C. Edmond Turcu, Rutherford Appleton Lab. (United States)


Published in SPIE Proceedings Vol. 3157:
Applications of X Rays Generated from Lasers and Other Bright Sources
George A. Kyrala; Jean-Claude J. Gauthier, Editor(s)

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