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Proceedings Paper

XUV laser grid image refractometry applied in laser hole boring experiments
Author(s): Kenjiro Takahashi; Ryosuke Kodama; Kazuo A. Tanaka; Hiroyuki Hashimoto; Yoshiaki Kato; Kunioki Mima; Kensuki Murai; Franz A. Weber; Troy W. Barbee; Peter M. Celliers; Luiz Barroca Da Silva
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Paper Abstract

We measured laser channeling into an overdense plasma by using a 19.6 nm Ne-like Ge XUV laser. One micrometer/100 ps laser light at 1017 W/cm2 interacted with a long scale length plasma preformed on a CH slab target. Grid image refractometry (GIR) with the x-ray laser was applied to obtain the deflection information in the plasma, which provided two dimensional density profiles (2-D) of the overdense plasmas.

Paper Details

Date Published: 1 November 1997
PDF: 8 pages
Proc. SPIE 3156, Soft X-Ray Lasers and Applications II, (1 November 1997); doi: 10.1117/12.279407
Show Author Affiliations
Kenjiro Takahashi, Osaka Univ. (Japan)
Ryosuke Kodama, Osaka Univ. (Japan)
Kazuo A. Tanaka, Osaka Univ. (Japan)
Hiroyuki Hashimoto, Osaka Univ. (Japan)
Yoshiaki Kato, Osaka Univ. (Japan)
Kunioki Mima, Osaka Univ. (Japan)
Kensuki Murai, Osaka National Research Institute (Japan)
Franz A. Weber, Lawrence Livermore National Lab. (United States)
Troy W. Barbee, Lawrence Livermore National Lab. (United States)
Peter M. Celliers, Lawrence Livermore National Lab. (United States)
Luiz Barroca Da Silva, Lawrence Livermore National Lab. (United States)


Published in SPIE Proceedings Vol. 3156:
Soft X-Ray Lasers and Applications II
Jorge J. G. Rocca; Luiz Barroca Da Silva, Editor(s)

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