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Proceedings Paper

Transient inversion XUV-lasers in Ti and Ge
Author(s): Peter Viktor Nickles; Matthias Schnuerer; Mikhail P. Kalachnikov; Wolfgang Sandner; Vyacheslav N. Shlyaptsev; Colin N. Danson; David Neely; E. Wolfrum; Jie Zhang; A. Behjat; A. Demir; Gregory J. Tallents; P. J. Warwick; Ciaran L. S. Lewis
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Paper Abstract

Low pump energy transient gain x-ray lasers in Ti at 32.6 nm, 30.15 nm, in V at 30.4 nm and Ge at 19.6 nm using picosecond pulse heating of a long pulse preformed plasma of neonlike ions has been realized for the first time. Gain saturation was demonstrated in Ti and Ge XRL. Results of pump consumption, x- ray divergence and output energy are given.

Paper Details

Date Published: 1 November 1997
PDF: 6 pages
Proc. SPIE 3156, Soft X-Ray Lasers and Applications II, (1 November 1997); doi: 10.1117/12.279405
Show Author Affiliations
Peter Viktor Nickles, Max-Born-Institut (Germany)
Matthias Schnuerer, Max-Born-Institut (Germany)
Mikhail P. Kalachnikov, Max-Born-Institut (Germany)
Wolfgang Sandner, Max-Born-Institut (Germany)
Vyacheslav N. Shlyaptsev, Colorado State Univ. (United States)
Colin N. Danson, Rutherford Appleton Lab. (United Kingdom)
David Neely, Rutherford Appleton Lab. (United Kingdom)
E. Wolfrum, Rutherford Appleton Lab. (United Kingdom)
Jie Zhang, Rutherford Appleton Lab. (United Kingdom)
A. Behjat, Univ. of Essex (United Kingdom)
A. Demir, Univ. of Essex (United Kingdom)
Gregory J. Tallents, Univ. of Essex (United Kingdom)
P. J. Warwick, Queen's Univ. of Belfast (Germany)
Ciaran L. S. Lewis, Queen's Univ. of Belfast (United Kingdom)

Published in SPIE Proceedings Vol. 3156:
Soft X-Ray Lasers and Applications II
Jorge J. G. Rocca; Luiz Barroca Da Silva, Editor(s)

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