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Proceedings Paper

High-resolution phase contrast microscopy with a hard x-ray waveguide
Author(s): Alessia Cedola; Peter Cloetens; Silvia Di Fonzo; Werner H. Jark; Stefano Lagomarsino; G. Soullie; Christian Riekel
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Paper Abstract

High energy x-ray phase contrast experiment with an unprecedent resolution is shown. The coherent and divergent submicron beam from an x-ray waveguide is used to realize a lensless microscope and to magnify spatial variations in optical path length 500 times or more. The defocused image of a nylon fiber with a resolution of 0.14 micron is presented. Exposure times as short as 0.1 seconds gave already visible contrast, opening the way to high resolution, real time studies.

Paper Details

Date Published: 1 November 1997
PDF: 7 pages
Proc. SPIE 3154, Coherent Electron-Beam X-Ray Sources: Techniques and Applications, (1 November 1997); doi: 10.1117/12.279388
Show Author Affiliations
Alessia Cedola, INFM (Italy), Istituto Elettronica dello Stato Solido (Italy)European Synchrotron Radiation Facility (Italy)
Peter Cloetens, European Synchrotron Radiation Facility (France) and Univ. of Antwerp (Belgium)
Silvia Di Fonzo, Sincrotrone Trieste (Italy)
Werner H. Jark, Sincrotrone Trieste (Italy)
Stefano Lagomarsino, CNR Istituto di Elettronica dello Stato Solido (Italy)
G. Soullie, Sincrotrone Trieste (Italy)
Christian Riekel, European Synchrotron Radiation Facility (France)


Published in SPIE Proceedings Vol. 3154:
Coherent Electron-Beam X-Ray Sources: Techniques and Applications
Andreas K. Freund; Henry P. Freund; Malcolm R. Howells, Editor(s)

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