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Proceedings Paper

Progress toward submicron hard x-ray imaging using elliptically bent mirrors
Author(s): Alastair A. MacDowell; Richard S. Celestre; Chang-Hasnain C. Chang; Keith D. Franck; Malcolm R. Howells; Scott C. Locklin; Howard A. Padmore; J. R. Patel; Reuben Sandler
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Paper Abstract

Of the many methods used to focus x-rays, the se of mirrors with an elliptical curvature shows the most promise of providing a sub-micron white light focus. Our group has been developing he techniques of controlled bending of mirror substrates in order to produce the desired elliptical shape. We have been successful in producing surfaces with the required microradian slope error tolerances. Details of the bending techniques used, results from laboratory slope error measurements using a Long Trace Profiler and data from the measurement of focus shape using knife edge and imaging methods using x-rays in the 5 - 12 KeV energy range are presented. The development of a white light focusing opens many possibilities in diffraction and spectroscopic studies.

Paper Details

Date Published: 1 November 1997
PDF: 8 pages
Proc. SPIE 3152, Materials, Manufacturing, and Measurement for Synchrotron Radiation Mirrors, (1 November 1997); doi: 10.1117/12.279374
Show Author Affiliations
Alastair A. MacDowell, Lawrence Berkeley National Lab. (United States)
Richard S. Celestre, Lawrence Berkeley National Lab. (United States)
Chang-Hasnain C. Chang, Lawrence Berkeley National Lab. (United States)
Keith D. Franck, Lawrence Berkeley National Lab. (United States)
Malcolm R. Howells, Lawrence Berkeley National Lab. (United States)
Scott C. Locklin, Lawrence Berkeley National Lab. (United States)
Howard A. Padmore, Lawrence Berkeley National Lab. (United States)
J. R. Patel, Lawrence Berkeley National Lab. (United States)
Reuben Sandler, Lawrence Berkeley National Lab. (United States)


Published in SPIE Proceedings Vol. 3152:
Materials, Manufacturing, and Measurement for Synchrotron Radiation Mirrors
Peter Z. Takacs; Thomas W. Tonnessen, Editor(s)

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