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Proceedings Paper

Synchrotron microtomography: system design and application to fluids in small channels
Author(s): John H. Dunsmuir; Minyao Zhou; Brian P. Flannery; Michael Amabile; Anne-Marie Lanzillotto; Tzong-Shyng Leu; Ravi Samtaney; Richard P. Wildes
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Paper Abstract

The Exxon microtomography facility at the National Synchrotron Light Source (NSLS) located at Brookhaven National Laboratory has constantly evolved since its first operation in 1986. This evolution has been driven by improvement in imaging technology and by research applications particularly the study of fluids in man-made structures and random porous media. The present facility provides tunable x-ray energies between 6 and 35 keV and acquires 1024 cubes of 14 bit x-ray image data with a resolution of a few microns in about one hour. Image data is reconstructed using direct Fourier inversion. We present a brief overview of the system configuration and how the application of differential absorption contrast microtomography across the iodine K edge to the characterization of multi-phase fluids in sandstones. We also present a simple method for computing the nuclear magnetic resonance T2 relaxation spectrum directly from the CT data. Recently the system has been upgraded to radiographically image at high sped multi-phase fluid flow in small channels such as in petroleum reservoir rocks and in microelectromechancial systems. Expansion of the high speed capability to tomographic imaging of specimens in 3D in near real time is currently in progress. The upgrades improve both image acquisition and reconstruction speed by employing multi-port CCD and parallel processing technologies. We will describe the design capabilities of the high speed system and will show results from the high speed imaging of fluid flow in small tubes.

Paper Details

Date Published: 24 October 1997
PDF: 8 pages
Proc. SPIE 3149, Developments in X-Ray Tomography, (24 October 1997); doi: 10.1117/12.279364
Show Author Affiliations
John H. Dunsmuir, Exxon Research and Engineering Co. (United States)
Minyao Zhou, Exxon Research and Engineering Co. (United States)
Brian P. Flannery, Exxon Research and Engineering Co. (United States)
Michael Amabile, Sarnoff Corp. (United States)
Anne-Marie Lanzillotto, Sarnoff Corp. (United States)
Tzong-Shyng Leu, Sarnoff Corp. (United States)
Ravi Samtaney, Sarnoff Corp. (United States)
Richard P. Wildes, Sarnoff Corp. (United States)

Published in SPIE Proceedings Vol. 3149:
Developments in X-Ray Tomography
Ulrich Bonse, Editor(s)

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