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Proceedings Paper

Fluorescent x-ray computed tomography to visualize specific material distribution
Author(s): Tohoru Takeda; Tetsuya Yuasa; Atsunori Hoshino; Masahiro Akiba; Akira Uchida; Masahiro Kazama; Kazuyuki Hyodo; F. Avraham Dilmanian; Takao Akatsuka; Yuji Itai
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Paper Abstract

Fluorescent x-ray computed tomography (FXCT) is being developed to detect non-radioactive contrast materials in living specimens. The FXCT systems consists of a silicon channel cut monochromator, an x-ray slit and a collimator for detection, a scanning table for the target organ and an x-ray detector for fluorescent x-ray and transmission x-ray. To reduce Compton scattering overlapped on the K(alpha) line, incident monochromatic x-ray was set at 37 keV. At 37 keV Monte Carlo simulation showed almost complete separation between Compton scattering and the K(alpha) line. Actual experiments revealed small contamination of Compton scattering on the K(alpha) line. A clear FXCT image of a phantom was obtained. Using this system the minimal detectable dose of iodine was 30 ng in a volume of 1 mm3, and a linear relationship was demonstrated between photon counts of fluorescent x-rays and the concentration of iodine contrast material. The use of high incident x-ray energy allows an increase in the signal to noise ratio by reducing the Compton scattering on the K(alpha) line.

Paper Details

Date Published: 24 October 1997
PDF: 13 pages
Proc. SPIE 3149, Developments in X-Ray Tomography, (24 October 1997); doi: 10.1117/12.279355
Show Author Affiliations
Tohoru Takeda, Univ. of Tsukuba (Japan)
Tetsuya Yuasa, Yamagata Univ. (Japan)
Atsunori Hoshino, Yamagata Univ. (Japan)
Masahiro Akiba, Univ. of Tsukuba (Japan)
Akira Uchida, Yamagata Univ. (Japan)
Masahiro Kazama, Univ. of Tsukuba (Japan)
Kazuyuki Hyodo, National Lab. for High-Energy Physics (Japan)
F. Avraham Dilmanian, Brookhaven National Lab. (United States)
Takao Akatsuka, Yamagata Univ. (Japan)
Yuji Itai, Univ. of Tsukuba (Japan)

Published in SPIE Proceedings Vol. 3149:
Developments in X-Ray Tomography
Ulrich Bonse, Editor(s)

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