Share Email Print

Proceedings Paper

Hard x-ray phase tomographic investigation of materials using Fresnel diffraction of synchrotron radiation
Author(s): Gilles Peix; Peter Cloetens; Murielle Pateyron-Salome; Jean-Yves Buffiere; Jose Baruchel; Francoise Peyrin; Michel Schlenker
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

Hard x-ray tomographic images with high spatial resolution were obtained at he European Synchrotron Radiation Facility in Grenoble. They clearly display damage initiation within materials submitted to monotonic tensile test. Strain- induced cracks with opening of less than 1 micrometer are detected, as are slight differences in composition between constituent phases. These observations are based on the Fresnel diffraction fringes associated with local jumps in the optical phase of x-rays transmitted through the sample. The high lateral coherence of third generation synchrotron radiation sources is essential for the application of this instrumentally simple technique.

Paper Details

Date Published: 24 October 1997
PDF: 9 pages
Proc. SPIE 3149, Developments in X-Ray Tomography, (24 October 1997); doi: 10.1117/12.279354
Show Author Affiliations
Gilles Peix, INSA (France)
Peter Cloetens, European Synchrotron Radiation Facility (France)
Murielle Pateyron-Salome, INSA (France)
Jean-Yves Buffiere, INSA (France)
Jose Baruchel, European Synchrotron Radiation Facility (France)
Francoise Peyrin, INSA (France)
Michel Schlenker, Lab. Louis Neel/CNRS (France)

Published in SPIE Proceedings Vol. 3149:
Developments in X-Ray Tomography
Ulrich Bonse, Editor(s)

© SPIE. Terms of Use
Back to Top