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Proceedings Paper

Time-of-flight measurements in Langmuir-Blodgett films of poly(3-hexylthiophene)
Author(s): Ronald Oesterbacka; Gytas Juska; Kestutis Arlauskas; Henrik Stubb
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Paper Abstract

Time-of-Flight (TOF) measurements in the voltage mode in thin films of poly(3-hexylthiophene) (PHT) have been studied. Thin films of PHT were fabricated using Langmuir- Blodgett (LB) technique giving unique possibility of controlling the thickness of sandwich type samples. We have used a method developed for the study of subnanosecond transients in thin films of amorphous semiconductors. The TOF signals have been measured in LB films for the first time, and a hole mobility of the order of 8 X 10-3 cm2/Vs in PHT LB films has been estimated.

Paper Details

Date Published: 1 December 1997
PDF: 6 pages
Proc. SPIE 3145, Optical Probes of Conjugated Polymers, (1 December 1997); doi: 10.1117/12.279290
Show Author Affiliations
Ronald Oesterbacka, Abo Akademi Univ. (Finland)
Gytas Juska, Vilnius Univ. (Lithuania)
Kestutis Arlauskas, Vilnius Univ. (Lithuania)
Henrik Stubb, Abo Akademi Univ. (Finland)

Published in SPIE Proceedings Vol. 3145:
Optical Probes of Conjugated Polymers
Z. Valy Vardeny; Lewis J. Rothberg, Editor(s)

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