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Proceedings Paper

Instrumentation for measuring NVIS displays: practical optimization for best performance
Author(s): Richard Young; William E. Schneider
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Paper Abstract

Displays providing NVIS compatibility must meet exacting standards. Instruments to test these devices must also perform to set minimum requirements, given in MIL-L-85762A appendix B. Traditionally, these requirements have been difficult to achieve in practice, and then only by compromising measurement conditions. A combination of new technology and application- oriented optimization of the spectroradiometer has led to recent revolutionary changes in NVIS measurement instrumentation. The optimizations possible, the mechanisms of achieving these optimizations, and the impact of any differences on measurements are discussed for two commercial instruments.

Paper Details

Date Published: 26 September 1997
PDF: 10 pages
Proc. SPIE 3140, Photometric Engineering of Sources and Systems, (26 September 1997); doi: 10.1117/12.279234
Show Author Affiliations
Richard Young, Optronic Labs., Inc. (United States)
William E. Schneider, Optronic Labs., Inc. (United States)


Published in SPIE Proceedings Vol. 3140:
Photometric Engineering of Sources and Systems
Angelo V. Arecchi, Editor(s)

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