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Proceedings Paper

Temperature effect of self-pumped phase conjugation in photorefractive barium titanate crystals
Author(s): TienHsing Yang; Zen-Wen Hwang; Dong-Ming Wang
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Paper Abstract

The temperature dependence of the self-pumped phase conjugation phenomenon in the no-doping photorefractive barium titanate crystals is investigated. We found the no-signal time of a few seconds before observing the self-pumped phase conjugation. The no-signal time decreases as the temperature goes up until 110 degrees Celsius. Before 80 degrees Celsius, the rise time of self-pumped phase conjugation goes down exponentially. Higher than 80 degrees Celsius, we could not observe the steady signal of self-pumped phase conjugation, and it fluctuates between zero and saturate intensity randomly. The duration of zero intensity is longer and more when the temperature goes up from 80 degrees Celsius to 110 degrees Celsius. We use the mobile-ion model to explain the phenomenon. The increase of the mobility of charge carriers and the decrease of the relative dielectric constant with temperature can be used to explain the faster response time of self-pumped phase conjugation. That the absorption constant does not change and electro-optic coefficient decrease with temperature is used to explain the decrease of the diffracted intensity of self-pumped phase conjugation with temperature. The mobility of electrons is much larger than that of holes in the barium titanate crystals at elevated temperatures.

Paper Details

Date Published: 22 September 1997
PDF: 12 pages
Proc. SPIE 3137, Photorefractive Fiber and Crystal Devices: Materials, Optical Properties, and Applications III, (22 September 1997); doi: 10.1117/12.279192
Show Author Affiliations
TienHsing Yang, Chinese Naval Academy (Taiwan)
Zen-Wen Hwang, Chinese Naval Academy (Taiwan)
Dong-Ming Wang, Chinese Naval Academy (Taiwan)


Published in SPIE Proceedings Vol. 3137:
Photorefractive Fiber and Crystal Devices: Materials, Optical Properties, and Applications III
Francis T. S. Yu; Shizhuo Yin, Editor(s)

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