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Proceedings Paper

Relationship between microgrinding parameters and lens surface features
Author(s): Sheryl M. Gracewski; Yi Li; Y. Y. Zhou; Paul D. Funkenbusch; Jeffrey L. Ruckman
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Paper Abstract

In deterministic microgrinding (DMG) of glass optics with metal bond diamond abrasive ring tools, cutter marks are generated on the lens surface by the relative motion between the grinding tool and the work piece. The cutter marks for spherical surface generation appear as curves that follow contact lines between the abrasive ring tool and the work piece from the center to the edge of the lens. For DMG surfaces using a three tool process, individual cutter mark heights vary form approximately 5 to 100 nm with a variable spatial separation of from 0.1 to 3 mm along the circumference of the lines. The number of cutter marks generated for one revolution of the work piece is typically equal to the ratio of the tool RPM to the work piece RPM. In this paper we describe experiments designed to investigate the relationship between machine vibration characteristics and cutter mark generation and to identify process parameters that most strongly influence the generation of cutter marks. Machine vibration is monitored during grinding with accelerometers, positioned in the x, y, and z directions and located on the tool spindle. A fast Fourier transform (FFT) is used to identify the dominant frequency components of the machine vibration. The fine ground surfaces obtained with the machine are hen measured with interferometry and also analyzed with a FFT to identify periodic features. An experimental approach is employed to identify the microgrinding process parameters, such as tool speed, work piece speed, infeed rate, cutting edge bevel width, and dwell time that significantly influence the characteristics of the cutter marks. Process parameters can then be chosen to minimize cutter mark generation.

Paper Details

Date Published: 1 November 1997
PDF: 8 pages
Proc. SPIE 3134, Optical Manufacturing and Testing II, (1 November 1997); doi: 10.1117/12.279123
Show Author Affiliations
Sheryl M. Gracewski, Univ. of Rochester (United States)
Yi Li, Univ. of Rochester (United States)
Y. Y. Zhou, Univ. of Rochester (United States)
Paul D. Funkenbusch, Univ. of Rochester (United States)
Jeffrey L. Ruckman, Univ. of Rochester (United States)

Published in SPIE Proceedings Vol. 3134:
Optical Manufacturing and Testing II
H. Philip Stahl, Editor(s)

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